BOM (Bill of Materials)
Linking to the SOX modules FMEA and FTA
Standard failure rates catalogs: SN 29500, IEC 62380
Standard failure modes catalogs : Birolini, IEC 62380
Import or create your Bills of Materials (BOMs) in the SOX Reliability module. FIT values are calculated in the SOX RE module in compliance with project-specific profiles and can be used for various analyzes.
SOX also enables the semiquantitative analysis from semiconductors down to their parts (DIE and Package) and sub-areas (Blocks), according to ISO26262 (part 11) and ISO PAS 19451.
Definition of BOMs (Bill of Materials)
Create extensive and detailed bills of material with little effort. The SOX Reliability Editor provides you with suitable filters and short cuts, which optimally support you in your workflow. The supplied, expandable catalogs of failure rates (SN29500, IEC62380) and failure modes (IEC62380, Birolini) give you a wide range of options to carry out a reliability analysis according to your specifications.
Import/Export of BOMs With Excel Data
SOX can be integrated into your previous development environment. With the SOX BOM template you can exchange and update your BOMs between SOX and Microsoft Excel to your wish. The calculated or imported values can be transferred to the quantitative analyzes (FMEDA, FTA).
Failure Rates and Failure Mode Catalog
The supplied catalogs of failure rates and failure modes contain all the corresponding parameters and values defined in the relevant standards. Rather, you can modify and extend these catalogs as desired or create individual catalogs. These catalogs are also available for your users globally and can be provided with a rights and roles concept.
Definition of Mission and Temperature Profiles
Create and define temperature and mission profiles that you can reuse as often as you like. These can also be combined into catalogs.
SOX Semiconductor Reliability Enhancements
Calculation of failure rates for
semiconductors is performed in a top-down approach which determines fit rates at package and DIE levels using the
mathematics defined in ISO26262 with IEC62380 or SN29500.
Relevant data for fit calculation is presented in a clear and concise GUI that re-calculates fit values directly on parameter changes.
Calculated λDIE is distributed to lower level blocks by specifying a percentage value for each block or alternatively by specifying a block size.
Calculated λDIE is uniformly distributed
to all pins of the package.
SOX Semicon provides detailed
information on intermediate calculation results at all levels of the calculation.
The powerful catalog concept of SOX now
also encompasses mission profile and
temperature profile catalogs.
Standard mission profiles and
temperature profiles as defined by
IEC62380 are already available.
Company specific profiles can easily be
added using public catalogs.
In conjunction with SOX server, these
profiles can be provided to any engineer
working with SOX. Due to SOX’s
sophisticated client server technology and
relational database backend all data is
available to each engineer in real time.
The new SOX mission profile editor for company specific mission profiles
The new SOX temperature profile editor for company specific Temperature profiles
SOX now provides relevant failure modes
catalogs of ISO26262 Part 5 and Part 11.
The failure mode definitions can be
assigned to components by simple Drag and Drop operations.
Customer specific catalogs can be added
and provided to all engineers just like the
mission and temperature profile catalogs.
In order to cover Soft Errors on
semiconductor devices SOX introduced
the concept of FIT Analysis Type. One or
more Fit Analysis Types can be added to a
SOX BOM document. Each FIT Analysis Type
can be assigned to any Component or
Module.
For each assigned FIT Analysis Type the
engineer can manually capture FIT data or
even use IEC62380 or SN29500 calculations
to calculate FIT values according to the
relevant calculation scheme.
An assigned FIT Analysis Type behaves
similar to the default component FIT
analysis. It gives you the option to model
failure modes and diagnostic coverage and provides FIT Analysis Type specific metrics.
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